Reliability Characterization and Prediction of Integrated Circuits.

Abstract

The objective of the program is to develop analytical techniques for reliability characterization and prediction of integrated circuits for use by USAF project engineers and contractors in reliability design and evaluation of USAF microelectronic equipments. To accomplish the objective a comprehensive study will be made of principal factors that influence the failure rate of integrated quality control, screening, application, and cost. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1969
Accession Number
AD0860329

Entities

People

  • David C. Porter
  • Warren A. Finke

Organizations

  • Boeing

Tags

DTIC Thesaurus Topics

  • Circuits
  • Contractors
  • Electronic Equipment
  • Engineers
  • Integrated Circuits
  • Quality Control
  • Reliability
  • Test And Evaluation
  • Test Equipment

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Life Cycle Cost Analysis

Technology Areas

  • Microelectronics