Validation of a Digital Computer Program for Use in Predicting the Vulnerability of Missile Systems Exposed to High Level Electromagnetic Fields,

Abstract

This report describes the methods used and the affirmative results in validating a computer program developed for the Army to determine the effect of high level radio frequency radiation on missile systems. The methods described were used to uniformly radiate models of transmission lines by high level radio frequency radiators at White Sands Missile Range, New Mexico, and by coupling at a single location in the Test and Reliability Evaluation Laboratory, Research and Development Directorate, U. S. Army Missile Command, Redstone Arsenal, Alabama. New methods of computing and measuring the effects of effective resistance and permeability of conductors and the dielectric constant and dissipation of insulation are discussed. Effects of sunlight on dielectrics were measured. Measurements verified the computed characteristics of coupling of radio frequency power injected into the model at discrete locations to simulate nonuniform shielding and the effects of mismatched terminations with reference to the complex characteristic impedance of the models. New techniques are given for determining the absolute field strength present at the exact location of the model immersed in an electromagnetic field. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1968
Accession Number
AD0860423

Entities

People

  • Carl L. Frederick Sr.

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Computer Programs
  • Computers
  • Dielectric Permittivity
  • Digital Computers
  • Electromagnetic Fields
  • Frequency
  • New Mexico
  • Radiation
  • Radio Frequency
  • Radio Frequency Power
  • Reliability
  • Shielding
  • Test And Evaluation
  • Transmission Lines

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Missile Defense Systems.
  • Spectroscopy.

Technology Areas

  • Microelectronics