The Formation and Characteristics of a Broad-Area Semiconductor Field Emission Cathode.

Abstract

The work is a study of the formation, operation and application of a semiconductor field emission cathode consisting of one or more individual emitting points on a broad area cathode. The material primarily used was germanium. Two methods of forming these cathodes were studied; a vacuum breakdown method and one using radiation from a pulsed ruby laser focused on the cathode surface. The former is the method by which the cathode was first revealed. The latter holds the most promise for making cathodes practical. Both types of cathodes were observed with a scanning electron microscope to aid in understanding the mechanism by which the very regular emitting points are formed. The electrical characteristics of the cathode were studied experimentally and found to agree with theory of semiconductor field emission. A retarding potential analyzer was designed and built to measure the energy distribution for electrons emitted from individual points on the cathode. An electron optical system was used to study the operation of the semiconductor cathode as an electron source for such applications as in a cathode ray tube or similar device requiring a low-current electron beam. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1969
Accession Number
AD0863006

Entities

People

  • John W. Hanson

Organizations

  • Cornell University College of Engineering

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Cathode Ray Tubes
  • Corpuscular Radiation
  • Electromagnetic Radiation
  • Electron Beams
  • Electron Microscopes
  • Electrons
  • Emission
  • Field Emission
  • Materials
  • Microscopes
  • Radiation
  • Ruby Lasers
  • Scanning Electron Microscopes
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Plasma Physics.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics