LSI Correlator.
Abstract
An integrated circuit test pattern was designed to demonstrate the integrability and performance of one correlator bit, associated clock drivers, voltage reference sources, and numerous test devices. Two circuit versions of a correlator bit were designed and analyzed, one with Schottky barrier diode clamps and one without. Schottky barrier diodes were fabricated using aluminum, titanium-aluminum, moly-gold, and chromium-silicon monoxide. The latter showed highest yield and best electrical characteristics. Shallow junction transistor devices were fabricated to prepare for the correlator test pattern fabrication phase. Computer analysis results were obtained on the SBD and DCC correlators. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 30, 1969
- Accession Number
- AD0863222
Entities
Organizations
- TRW Inc.