An X-Ray Diffraction Study of Chromium-Gold Thin Films.
Abstract
The chromium-gold thin films system was studied using direct recording X-ray diffraction. Chromium and/or gold thin films were deposited, in vacuum onto glass substrates at ambient and elevated temperatures. Those thin films deposited at ambient temperatures were later annealed. The resultant X-ray diffraction patterns were basically that of gold. The positions and relative intensities of the X-ray diffraction maxima varied with sample. This variation seemed to be a function of sample composition, deposition conditions, and post deposition treatment. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 23, 1969
- Accession Number
- AD0863238
Entities
People
- David A. Lutz
Organizations
- Naval Air Warfare Center Warminster