Infrared Data Analysis for Diagnosis, Isolation, and Prediction of Electronic Equipment Malfunctions.

Abstract

An infrared checkout technique for the diagnosis of faults in electronic circuits is described. A radiometric system for implementation of the technique is illustrated. This report presents a statistical analysis of infrared scan data which was obtained from a total of 170 printed-circuit panels of four different configurations. Conclusions are drawn regarding machine error, registration error, emissivity error, and the infrared diagnostic capability. The infrared technique is shown to be effective. A discussion follows on various beneficial applications and implementation requirements. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1969
Accession Number
AD0863793

Entities

People

  • Ruth A. Herman

Organizations

  • Air Force Research Laboratory

Tags

DTIC Thesaurus Topics

  • Circuits
  • Data Analysis
  • Data Science
  • Electronic Circuits
  • Electronic Equipment
  • Information Science
  • Printed Circuits
  • Statistical Analysis
  • Test Equipment

Readers

  • Atmospheric Remote Sensing.
  • Computational Modeling and Simulation
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems