User's Manual for the Network EMP Damage Analysis Program (NEDAP)

Abstract

The Network EMP Damage Analysis Program is a linear circuit analysis program oriented toward damage to semiconductor devices by high level voltage and current transients. The program uses the damage levels input for each device and predicts component damage based on this power level and the normal operation of the device as calculated by the program's transient analysis.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 30, 1970
Accession Number
AD0866168

Entities

People

  • Hugh W. Greene
  • Wayne F. Spruell

Tags

Communities of Interest

  • Biomedical
  • Energy and Power Technologies
  • Human Systems
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Artillery
  • Cost Reductions
  • Engineering
  • Enlisted Personnel
  • Lessons Learned
  • Military Operations
  • Military Personnel
  • Officer Personnel
  • Personnel Management
  • Radio Equipment
  • Security
  • Semiconductor Devices
  • Strategic Communications
  • Systems Management
  • Test And Evaluation
  • United States
  • Warfare

Fields of Study

  • Physics

Readers

  • Computer Science.
  • Electrical Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems