Backscatter Mossbauer Techniques Applied to Deterioration Modes in Metals.

Abstract

The effects of various experimental parameters on Mossbauer Effect reflection spectra using 6.3 keV X-rays, 14.4 keV gamma-rays and 7.3 keV internal conversion electrons were investigated. Source, sample, and detector geometry as well as shielding arrangements were studied in order to optimize resolution and signal to noise for a given measurement time. The effects of the single channel analyzer settings were determined. The experimental techniques acquired in this fashion were applied to studies of several deterioration modes in steel. Surface Stress: Magnetic domain ordering due to induced and residual stress caused a change in the peak height ratio A2/A1. The effect was observed in a sample of A515-60 steel under tensile test and in shot-peened cast iron. The ratio increases with increasing tension, and provides a useful means of monitoring surface stress. Dissolved Hydrogen: The predicted effect of dissolved hydrogen on reflection Mossbauer Effect spectra of steel, i.e., more positive values for the isomer shift, was observed. This indicates the possibility of devising an NDT for hydrogen embrittlement of high strength steels. Nitriding: The nitriding of 4140 steel had pronounced effects on the Mossbauer spectra. Based on this data, the Mossbauer Effect could be used as a quality control check on nitrided steel. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1969
Accession Number
AD0866795

Entities

People

  • Gerald L. Auth
  • John H. Terrell
  • Richard K. Briskman

Tags

DTIC Thesaurus Topics

  • Detectors
  • Ferrium
  • Gamma Rays
  • Hydrogen
  • Hydrogen Embrittlement
  • Internal Conversion
  • Magnetic Domains
  • Measurement
  • Mossbauer Effect
  • Quality Control
  • Residual Stress
  • Shielding
  • Spectra
  • Steel
  • Stresses
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Solar Physics
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Microelectronics