Radiation Hardening Circuitry Using New Devices.
Abstract
The objectives of this program were to develop and demonstrate radiation hard logic circuits using Ovonic switches as the only active components, and to determine the extent to which these circuits are radiation hard. The circuit configurations selected were an astable multivibrator, an AND/OR gate with complementary outputs and a J-K flip-flop. Of the two circuit designs evaluated under the program, the one selected for circuit fabrication uses Dual Ovonic Threshold Switches and a square wave power supply. Although the Ovonic devices and circuits used in this program were not optimized for speed of operation nor for operation in a radiation environment, the feasibility of using amorphous semiconductor devices to perform logic functions was successfully demonstrated, and all circuits exhibited a transient ionizing radiation tolerance of at least 1 x 10 to the 11th power (Si)/s and a neutron radiation tolerance of at least 1 x 10 to the 16th power n/sq cm (1 meV equivalent) without circuit malfunction. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1970
- Accession Number
- AD0866972
Entities
People
- D. J. Niehaus
- D. L. Nelson
- H. C. Chambers
- R. L. Fowler
- R. R. Shanks