Preconditioning, Group A and Group B Tests on 1N827A(spl) Glass Reference Element IAW Sperry P. O. 23604.

Abstract

The report contains qualification tests for diodes semiconductors for use in Shrike missile systems.

Document Details

Document Type
Technical Report
Publication Date
Jun 27, 1967
Accession Number
AD0867678

Entities

Organizations

  • Naval Air Weapons Station China Lake

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Electronics
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Qualifications
  • Semiconductors
  • Silicon Carbide
  • Solid State Electronics

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems