Quality Verification Test Report on Semiconductor, Transistor, Field Effect, Silicon, N-Channel, Planar, Metal Can.

Abstract

The purpose of the test report is to discuss the results of the Quality Verification Tests which were performed on a sample of 128 units to determine their conformance to NAVAIR Drawing Number 2604664. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 29, 1969
Accession Number
AD0869638

Entities

Organizations

  • Naval Air Weapons Station China Lake

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Electronics
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Semiconductor Devices
  • Semiconductors
  • Silicon Carbide
  • Solid State Electronics
  • Transistors
  • Verification
  • Verification Tests

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene