Failure Analysis of Minuteman Integrated Circuit Failures.
Abstract
The report describes experience in determining the actual reliability of Minuteman integrated circuits. The device constructions and evolution are discussed in terms of the materials, design, testing, and failure analysis of these circuits. System failures are shown to occur because of either improper device designs or inefficient inspections and testing. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1970
- Accession Number
- AD0870725
Entities
People
- Clay W. Scott
- L. K. Gillette
- S. T. Higashi