LSI Correlator.
Abstract
The CTP correlator test pattern was tested and evaluated. As a result, the correlator design will incorporate Schottky diodes and cermet resistors. The Schottky clamped transistors were shown to be effective in reducing storage delay through +125C. The circuit performed the proper function of correlation. The CTP evaluation revealed that the speed-power product performance can be improved by modifying the device and circuit design. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 31, 1970
- Accession Number
- AD0871044
Entities
People
- David R. Breuer
Organizations
- TRW Inc.