Dielectric Measurements on High-Temperature Materials

Abstract

Measuring techniques and calculation procedures for complex dielectric constants are extended to temperature ranges 4 to 2000 degree K, and frequency C.008 Hz to 90 GHz. BN, Si02, sapphire, and spinel, all of which have good high-temperature properties, were tested. Methods of interpreting dielectric data and computer programs for finding the components of complex spectra are discussed. Measurements data are presented in graphical and/or tabular form. (KF-PL).

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1970
Accession Number
AD0873038

Entities

People

  • Jennifer Iglesias
  • W. B. Westphal

Organizations

  • Massachusetts Institute of Technology

Tags

DTIC Thesaurus Topics

  • Air Force
  • Aluminum Oxides
  • Ceramic Materials
  • Computer Programs
  • Computers
  • Contracts
  • Dielectric Permittivity
  • Dielectric Properties
  • Dielectrics
  • Frequency
  • High Temperature
  • Materials
  • Materials Laboratories
  • Measurement
  • Silicon Dioxide
  • Spectra
  • Standing Waves

Fields of Study

  • Physics

Readers

  • Computer Science.
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Surface Engineering/Surface Coating Technology.