Sperry Rand, SD4459H-1, LA-1Q, P.O. No. 221564.

Abstract

The report presents the results of electrical and environmental tests made on planar silicon matched semiconductor devices for Shrike applications.

Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1969
Accession Number
AD0873225

Entities

Organizations

  • Naval Air Weapons Station China Lake

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Electronics
  • Environmental Tests
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics

Technology Areas

  • Microelectronics