Short Pulse Theory and Verification Program.
Abstract
A series of high resolution backscatter measurements was made of various object shapes using the 2 short pulse model range facility. The resolution cell was varied from 0.5 nanosecond to 3.5 nanoseconds in six steps. Both phase and amplitude of the returns from individual scatterers were recorded on magnetic tape for use in existing computer programs which track these scatterers as a means of indentification. Criteria of phase versus polarization and identification versus resolution was considered. Analog plots were made which demonstrate the capability of the facility and help to confirm the scattering center concept. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1970
- Accession Number
- AD0874352
Entities
People
- Donald R. Mccoy
- Jiunn S. Yu
Organizations
- General Electric