Electroreflectance. Part 3. Transverse Electroreflectance.

Abstract

The new technique of transverse electroreflectance (TER) for observing the Seraphin effect is presented. It offers additional symmetry information on optical interband thresholds and eliminates photon-energy restrictions inherent in previous techniques. Gamma irradiation has been used to increase the resistivity of germanium to make it a suitable material for study by the TER method. Detailed measurements of polarization-dependent TER from 0.6 to 4.7 eV on gamma-ray-compensated germanium are reported. The contribution of piezoelectric strain to electroreflectance is discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1971
Accession Number
AD0887872

Entities

People

  • David S. Kyser
  • John E. Fischer
  • Nicholas Bottka
  • Victor L. Rehn

Organizations

  • Naval Air Weapons Station China Lake

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Advanced Materials
  • Engineered Materials
  • Gamma Rays
  • Germanium
  • Materials
  • Measurement
  • Metamaterial Absorbers
  • Metamaterials
  • Polarization
  • Symmetry
  • Transverse

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design