Optical Performance Calculations for Thin Films at 10.6 Microns.
Abstract
The Admittance Matrix Method is used to make calculations of the performance of quarter-wave optical multilayer stacks for high reflectances. The performance of various nonabsorbing multilayer stacks is shown and the calculations can be used to estimate the optical performance of low-absorption materials. A study of specific multilayer stacks with low absorption at 10.6 microns has been completed. The effect of variations in thickness of individual layers is shown, and it is concluded that fairly stringent control of thickness must be maintained across the reflector to ensure negligible phase degradation in the reflected wavefront. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1971
- Accession Number
- AD0888047
Entities
People
- D. A. Holmes
- J. E. Korka
Organizations
- Air Force Research Laboratory