Procedural Guidelines for the Reliability Assessment of MOS Microcircuits.
Abstract
The objective of this study program was the development of a set of procedural guidelines for effectively assuring, predicting and assessing the reliability of MOS integrated circuits. The end product of the study was a set of recommendations for additions or modifications to portions of MIL-STD-883 as they would apply to the screening and reliability verification of MOS IC's. The two approaches to the investigation included, first, a canvass of the industry, both manufacturers and users of MOS IC's, combined with a proposal for an optimized and practical set of screens and reliability verification procedures based upon in-house experience as well as upon the response to the industry canvass. The second approach was to select a moderately complex test vehicle, namely the dual-fifty bit shift register using the 'p' channel enhancement mode of operation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1971
- Accession Number
- AD0888286
Entities
People
- Henry J. Ewald