Microcircuit Crystal Oscillator.

Abstract

The Reliability Test (6220 hours total) was continued and results from the 2000 and 3000 hour data points is presented. No failures are apparent at this point. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1971
Accession Number
AD0890586

Entities

People

  • William H. Foulds

Tags

DTIC Thesaurus Topics

  • Circuits
  • Crystal Oscillators
  • Electronic Equipment
  • Microcircuits
  • Oscillators
  • Reliability

Technology Areas

  • Microelectronics