Instrumentation and Procedures for Low-Background Detector Measurements (Photodetector Series, 82nd Report).

Abstract

The purpose of this program is to provide an 'in-house' government capability for measuring and characterizing the performance of infrared sensors operating under low-background conditions. Instrumentation is being developed to allow detector measurements at background flux levels from 1,000,000 to 10 to the 16th power photons/sec/sq cm, over the spectral range from 1 to 20 microns. The detector parameters to be measured and characterized are spectral response, responsivity, noise spectrum, frequence response, detector resistance, and detector impedance. These parameters will be measured and correlated as a function of background flux level, signal irradiance, and detector bias. Possible additional parameters which prove to be useful in describing the performance of a detector will, of course, be measured. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 19, 1970
Accession Number
AD0892972

Entities

People

  • D. C. Arrington
  • D. L. Stierwalt
  • J. D. Merriam
  • R. L. Bates
  • W. L. Eisenman

Organizations

  • Navy Electronics Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Detectors
  • Electromagnetic Wave Detectors
  • Governments
  • Impedance
  • Infrared Detectors
  • Instrumentation
  • Measurement
  • Measuring Instruments
  • Optical Detectors
  • Photodetectors
  • Resistance
  • Spectra
  • Warning Systems

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology
  • Spectroscopy.