Hardened Amplifier for Radiation Transients (HART). Phase II.
Abstract
The development of design techniques for use in radiation-hardened linear integrated circuits is described. Two linear integrated circuits were designed using the developed techniques. The two circuits are a read preamplifier and a dual-differential voltage comparator. The two circuits were fabricated to validate the developed techniques. Fabrication techniques such as dielectric-oxide isolation, nichrome resistors, small transistor geometries and gold doping were used. A new radiation-hardened package was used to encapsulate the devices. The die attach was an alloy of aluminum, germanium and zinc. Wire bonding was achieved using aluminum wire. Silicone resin was used over the bonds and on the die. A material test pattern was provided on each bar. Data was taken for each circuit radiation tested. A complete electrical test was performed on both circuits before they were sent for radiation tests. A comprehensive radiation test program was performed to evaluate the design techniques that were developed. The radiation test included neutron and gamma damage as well as transient response to flash x-ray and LINAC-simulated gamma dose rate. The results of the tests are discussed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1972
- Accession Number
- AD0894766
Entities
People
- Robert A. Stehlin
Organizations
- Texas Instruments