(Hg,Cd)Te High Reliability.

Abstract

This final report describes the design and responsive parameters of ten high reliability single element (Hg,Cd)Te detector devices. The infrared sensors, designated by Honeywell Part Number DLK13G1 are optimized for detectivity in the 8 to 14-micron spectral region. The units, with exception of final pump bake temperature, were fabricated as standard high reliability product line devices. In addition to achieving high performance, the goal was to provide devices capable of high temperature storage and vacuum integrity. With no firm program objective, efforts were directed at meeting the temperature vs altitude operational requirements for class 1 equipment of MIL-STD-810B. The program has been successful. The detectors exhibited performance in excess of the minimum requirements. Sound process techniques were applied for conformance to MIL-STD-810B. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 30, 1972
Accession Number
AD0904603

Entities

People

  • G. A. Robillard

Organizations

  • Honeywell International, Inc.

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Altitude
  • Detectors
  • High Reliability
  • High Temperature
  • Infrared Detectors
  • Optical Detectors
  • Optical Equipment
  • Reliability
  • Standards
  • Warning Systems

Readers

  • Semiconductor Device Technology
  • Software Engineering