A Technique for the Investigation of Bacterial Contamination Inside Electronic Components

Abstract

The advent of space rocketry has posed the problem of sterilizing probes which might impact an extra terrestrial body. Contamination and possible infection of these bodies with earth microorganisms could interfere with opportunities to investigate the origin of life on other planets. An impacted missile on the moon or one of the planets could result in shattering the probe and all its components. For this reason the missile and all its components must be sterile not only externally but internally as well. The main purpose of this study was to develop satisfactory techniques for detecting whether or not microorganisms may have been trapped during the manufacturing process within electronic components which would present a contaminating source upon breaking apart at impact. Hermetically sealed electronic components are especially considered.

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Document Details

Document Type
Technical Report
Publication Date
Mar 11, 1960
Accession Number
AD0907011

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Alkenes
  • Contamination
  • Electronic Components
  • Ethylene Oxide
  • Ethylenes
  • Infection
  • Jet Propulsion
  • Materials
  • Microorganisms
  • Oxides
  • Test And Evaluation
  • Transistors
  • Wound Infections

Readers

  • Astronomy and Astrophysics.
  • Software Engineering
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Space
  • Space - Orbital Debris