Charge Coupled Devices - Phase I.
Abstract
The discovery of the principle of charge coupling has completely revolutionized the field of solid state image sensors and promises for the first time the possibility of an all-solid-state, self-scanned, low-light-level, nonblooming imager. The objective of this 6-month contract was to design, build, and evaluate such a device using a surface channel technology. This report contains data and detailed information on all phases of this investigation. The design and performance, both electrical and optical, of 500 x 1 three-phase line scanners and 128 x 160 three-phase area arrays are discussed. Typical pictures taken with these devices are shown. The design and fabrication of a 100 x 100 two-phase area array is discussed. Other major topics include: experimental demonstration of various antiblooming CCD structures, experimental measurement of statistical CCD noise sources, analysis of the sensitivity and resolution of CCI's at low-light levels, experimental measurements involving the use of a CCI as an analog memory in frame-to-frame cancellation techniques, and a discussion of analog signal-processing applications of CCD's. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1973
- Accession Number
- AD0909039
Entities
People
- A. Danforth Cope
- James E. Carnes
- Karl H. Zaininger
- Michael G. Kovac
- Peter A. Levine
Organizations
- Sarnoff Corporation