Advanced Avionics Fault Isolation System (AAFIS). Volume 1. AAFIS Concepts.
Abstract
This report presents the results of a study of advanced test techniques for future digital systems. Since these systems will consist mainly of Large Scale Integrated (LSI) circuitry, the study was oriented towards solving the difficult problem of testing this very complex circuitry, while exploiting LSI technology for test purposes. It was found that sufficient built-in test logic can be incorporated on LSI arrays to achieve fault isolation to the Shop Replaceable Assembly (SRA). Power, cooling, timing and a test initiate signal are the only external functions needed for intermediate level (carrier shop) test. The cost and weight penalties for BIT are expected to be less than five percent, while the cost savings for external test equipment costs will be large and considerably exceed the force-wide costs for BIT. All of the test techniques presented within this report are well within the state-of-the-art, but their implementation will require adherence to testability constraints throughout the design process. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1973
- Accession Number
- AD0913527
Entities
People
- Donald W. Turner
- Gary E. Alderson
- Norman Benowitz
- Robert H. Bork
Organizations
- Hughes Aircraft Company