Development of Variable Affinity Barrier Photoemitter

Abstract

This research and development program was directed toward establishing the feasibility of fabricating high quantum efficiency photo emitters based on the Variable Affinity Barrier (VAB). Although extreme fabrication difficulties were encountered, which necessitated radical changes in emitter designs, a few samples did exhibit electron emission. However, these samples were short lived and photo emissive measurements could not be conducted. In all, three different design approaches were investigated. These were: (1) Fabricating VAB junctions using single crystal p type silicon, (2) Fabricating VAB junctions using epitaxial p on p+ silicon, and (3) Fabricating VAB junctions using a tin oxide film on p type silicon. Only the last approach was partially successful--emission occurred. However, the results do not preclude that the other two design approaches are unfeasible, but only that during this program it was not possible to fabricate the necessary geometries or heterojunctions.

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Document Details

Document Type
Technical Report
Publication Date
Nov 20, 1972
Accession Number
AD0914057

Entities

People

  • John L. Mize

Tags

DTIC Thesaurus Topics

  • Band Gaps
  • Band Structures
  • Charge Carriers
  • Electrical Properties
  • Electron Emission
  • Emission
  • Energy Bands
  • Geometry
  • Measurement
  • Optical Properties
  • Oxide Films
  • Photoexcitation
  • Resistance
  • Semiconductors
  • Silica Glass
  • Single Crystals
  • Solid State Electronics

Readers

  • Chemistry (specifically Chemical Fluorescence)
  • Semiconductor Device Technology
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Quantum Computing