Analysis for the Determination of Significant Characteristics of Runway Roughness
Abstract
To determine and evaluate significant characteristics of runway roughness, 40 runway elevation profiles from 14 runways were analyzed. Grade effects were removed by high-pass filtering at a maximum cutoff wavelength of 500 ft and the resulting profiles were shown to be both nonstationary and nongaussian. Since nonstationarity was caused by the long wavelength undulations, the profiles were again filtered at a maximum cutoff wavelength of 100 ft. These short wavelength profiles are shown to be sufficiently stationary for a compound characterization. The short wavelength components are modeled in the frequency domain while the long wavelength components are modeled by the distribution of relative maxima and minima per 1000 ft and the joint distribution of wavelength and amplitude of the maxima and minima. A method is presented for generating a simulated runway which has the characteristics of the real profiles used in the analysis.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1973
- Accession Number
- AD0916171
Entities
People
- Alan P. Berens
- Ronald K. Newman
Organizations
- University of Dayton