EMP Electronic Analysis Handbook

Abstract

The goal of this handbook for EMP Electronic Analysis is to provide the circuit designer with techniques and models for use in assessing the degree of hardness of the circuits he is designing. New concepts and interpretation of existing techniques are presented and serve as a basis for defining the future effort required to provide a complete subsystem analysis capability. Topics covered are: (1) A brief overview of the various facets of a susceptibility threshold analysis. (2) A discussion of upset threshold analysis including response considerations, selection of analysis method, data, and examples. (3) An analysis of the problem of circuit damage thresholds encompassing the same areas as (2). (4) A description and illustration of methods for determining cable source characteristics. Also included are several appendicies which present some analysis details, a semiconductor damage data base and a discussion of the Driving Point Impedance (DPI) analysis method.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1973
Accession Number
AD0918275

Entities

People

  • Byron P. Gage

Organizations

  • Boeing

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Bipolar Junction Transistors
  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Computer Programs
  • Digital Circuits
  • Electron Tubes
  • Electronic Circuits
  • Electronics Laboratories
  • Field Effect Transistors
  • Modules (Electronics)
  • Power Electronics
  • Semiconductor Devices
  • Semiconductor Junctions
  • Semiconductors
  • Wiring Diagrams

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics