Multilayer Interconnections for Hybrid Microcircuits.

Abstract

This program covered an investigation of the failure modes and mechanisms for two types of ceramic multilayer substrates mounted within a hermetic package; and the development of suitable tests which were modified and are submitted as recommendations for the evaluation and/or qualification testing of high reliability substrates. The technical guidelines for the contract specify the two types of test substrates as follows: (1) Thick Film Multilayer Conductor System composed of successive layers of screened conductors and dielectrics, and (2) Homogeneous Metal-Ceramic Multilayer System composed of individual layers of green ceramic, each layer having a conductor pattern. These layers are stacked and fired simultaneously to form a monolithic metal-ceramic multilayer structure.

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1974
Accession Number
AD0918501

Entities

People

  • John R. Moore

Organizations

  • Sylvania Electric Products

Tags

DTIC Thesaurus Topics

  • Contracts
  • Dielectrics
  • Failure Mode And Effect Analysis
  • Films
  • High Reliability
  • Microcircuits
  • Performance (Engineering)
  • Qualifications
  • Reliability
  • Substrates
  • Test And Evaluation
  • Thick Films

Readers

  • Software Engineering
  • Surface Engineering/Surface Coating Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene