Evaluation of Background Suppression Techniques for 3-5 Micrometer Solid State Imagers.
Abstract
This report presents the results of a study on the operation of integrating infrared detectors against high background levels. The limited dynamic range and fixed pattern noise, generated by nonuniformities within a detector array, are shown to be the major limitations of infrared imaging systems employing integrating detectors. Several approaches to overcome these limitations are discussed and analyzed in terms of the performance of a hypothetical infrared imaging system. An analytical comparison of indium antimonide charge coupled devices (CCD) and charge injection devices (CID) shows that the CID is considerably less affected by the interface state density and by geometry tolerances than the CCD. These features, combined with higher sensitivity and almost no restrictions on geometry and readout sequence, make the InSb CID detector an attractive and viable sensor for infrared imaging systems. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1974
- Accession Number
- AD0921805
Entities
People
- William J. Baldwin
Organizations
- General Electric