Acquisition of a High-Resolution High-Intensity X-ray Diffractometer for Research and Education
Abstract
NMSU acquired a high-resolution high-intensity x-ray diffractometer for research and education. A PANalytical Empyrean system was acquired and installed, with three types of incident beam optics, two sample cradles, and two detectors. This instrument allows powder diffraction, x-ray reflectivity, texture and pole figure, and small-angle x-ray scattering measurements. It is also suitable for high-resolution diffraction, including triple-axis reciprocal space maps for symmetric and asymmetric Bragg reflections. A one-dimensional line detector significantly decreases data acquisition time for certain measurements. Commercial software allows data analysis, modeling, and fitting of lattice parameters. The instrument currently has 23 authorized users from the departments of Physics, Chemistry and Biochemistry,Chemical and Materials Engineering (5 faculty, 15 graduate students, 3 undergraduate students). In the spring of 2015, the instrument wasused for an instructional laboratory course in modern physics. The PI will teach a course on x-ray diffraction in the fall of 2015. The instrument has been fully tested for some of its capabilities and testing is in progress for others. Comprehensive data were acquired for pseudomorphic germanium-tin alloys grown on germanium by molecular beam epitaxy. Other projects involve nickel alloy thin films andrelated silicides, complex metal oxides, ferroelectrics, and powders of nanoparticles.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 20, 2015
- Accession Number
- AD1001082
Entities
People
- Stefan Zollner
Organizations
- New Mexico State University