Bit Error Ratio Test Equipment for High Speed Vertical Cavity Transistor Laser and MicroCavity VCSEL and Photo Receiver

Abstract

In the previous DURIP award (W911NF-13-1-0287), we reported the calibration data of the electrical loop back test of the SHF 12103ADual Differential Channel 56 Gbps Bit Pattern Generator (BPG) and the eye diagram of the optical transmission produced with our (highspeed integrated circuit group, HSIC) high speed microcavity VCSEL and the SHF 12103 BPG. In this case, only transmission BPG of devices can be characterized, however, the receiving data error transmission cannot be analyzed.In this DURIP award (W911NF-14-1-0575), we have recently purchased and received the SHF 11104A Dual Differential Channel 60 Gb/sError Analyzer (EA) module, which is the counter part of the SHF 12103A BPG required for a complete data transmission analysis alongwith 70 GHz remote sampling. Both the electrical and optical calibration result of the EA and the data transmission performance of HSIChigh speed microcavity laser (VCSEL) are presented.

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Document Details

Document Type
Technical Report
Publication Date
Aug 31, 2015
Accession Number
AD1001287

Entities

People

  • Curtis Wang
  • Milton Feng

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Analyzers
  • Calibration
  • Contracts
  • Data Rate
  • Data Transmission
  • Department Of Defense
  • Detectors
  • Dual Channel
  • Engineering
  • Generators
  • Integrated Circuits
  • Measurement
  • Military Research
  • Oscilloscopes
  • Standards
  • Students
  • Test Equipment

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Data Mining and Knowledge Discovery.
  • Electronics Engineering

Technology Areas

  • Directed Energy