FTIR Characterization of Carbon Nanotube Films - Coatings for the Microbolometer
Abstract
In the last report, reflectance analyses performed on the old aligned carbon nanotube sample CS089N (CNT/Ni/TiN/Si) revealed a sharp drop in reflectance for the CNT coated sample as compared to its TiN coated Si substrate. New CNT samples are produced and analyzed hereafter for their transmittance, reflectance and absorbing properties of our CNTs.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 31, 2013
- Accession Number
- AD1003993
Entities
People
- Andranik Sarkissian
- Jean-baptiste A. Kpetsu
- Kazem Zandi
- Philippe Merel
- Philips Laou
- Suzanne Paradis