Low Leakage Superconducting Tunnel Junctions with a Single Crystal Al2O3 Barrier
Abstract
We have developed a two-step growth scheme for single-crystal Al2O3 tunnel barriers. The barriers are epitaxially grown on single-crystal rhenium (Re) base electrodes that are grown epitaxially on a sapphire substrate, while polycrystalline Al is used as the top electrode. We show that by first growing an amorphous aluminum (Al) oxide layer at room temperature and crystallizing it at a high temperature in oxygen environment, a morphologically intact single-crystal Al2O3 layer is obtained. Tunnel junctions fabricated from these trilayers show very low subgap leakage current. This single-crystal Al2O3 junction may open a new venue for coherent quantum devices.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 30, 2016
- Accession Number
- AD1004413
Entities
People
- D. P. Pappas
- J. M. Martinis
- K. Cicak
- K. D. Osborn
- Ken B. Cooper
- M. Steffen
- R. Mcdermott
- R. W. Simmonds
- Sangheon Oh
Organizations
- National Institute of Standards and Technology