High Power Microwave Interference Effects on Analog and Digital Circuits in IC's

Abstract

Microwave or electromagnetic interference (EMI) can couple into electronic circuits and systems intentionally from high power microwave (HPM) sources or unintentionally due to the proximity to general electromagnetic (EM) environments, and cause soft reversible upsets and hard irreversible failures. As scaling-down of device feature size and bias voltage progresses, the circuits and systems become more susceptible to the interference. Thus, even low power interference can disrupt the operation of the circuits and systems. Furthermore, it is reported that even electronic systems under high level of shielding can be upset by intentional electromagnetic interference (IEMI), which has been drawing a great deal of concern from both the civil and military communities, but little has been done in terms of systematic study and investigation of these effects on IC circuits and devices. We have investigated the effects of high power microwave interference on three levels, (a) on fundamental single MOSFET devices, (b) on basic CMOS IC inverters and cascaded inverters, and (c) on a representative large IC timer circuit for automotive applications. We have studied and identified the most vulnerable static and dynamic parameters of operation related to device upsets. Fundamental upset mechanisms in MOSFETs and CMOS inverters and their relation to the characteristics of microwave interference (power, frequency, width, and period) and the device properties such as size, mobility, dopant concentration, and contact resistances, were investigated. Critical upsets in n-channel MOSFET devices resulting in loss of amplifier characteristics, were identified for the power levels above 10dBm in the frequency range between 1 and 20 GHz. We have found that microwave interference induced excess charges are responsible for the upsets.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2007
Accession Number
AD1005605

Entities

People

  • Kye C. Kim

Organizations

  • University of Maryland

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Computer-Aided Design
  • Digital Circuits
  • Electromagnetic Interference
  • Electronic Circuits
  • Electronic Equipment
  • Energy Bands
  • Frequency Domain
  • High Power Microwaves
  • Integrated Circuits
  • Logic Gates
  • Modules (Electronics)
  • P-N Junctions
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Transistors

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Fully Networked C3
  • Fully Networked C3 - Command and Control
  • Microelectronics