Nanofabrication of Arrays of Silicon Field Emitters with Vertical Silicon Nanowire Current Limiters and Self-Aligned Gates

Abstract

We developed a fabrication process for embedding a dense array (10 (exp 8) cm sq -2) of high-aspect-ratio silicon nanowires (200 nm diameter and 10 micrometers tall) in a dielectric matrix and then structured/exposed the tips of the nanowires to form self-aligned gate field emitter arrays using chemical mechanical polishing (CMP). Using this structure, we demonstrated a high current density (100 A cm sq -2), uniform, and long lifetime (>100 h) silicon field emitter array architecture in which the current emitted by each tip is regulated by the silicon nanowire current limiter connected in series with the tip. Using the current voltage characteristics and with the aid of numerical device models, we estimated the tip radius of our field emission arrays to be approx 4.8 nm, as consistent with the tip radius measured using a scanning electron microscope (SEM).

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Document Details

Document Type
Technical Report
Publication Date
Jun 13, 2016
Accession Number
AD1010691

Entities

People

  • Akintunde I. Akinwande
  • Stephen A. Guerrera

Organizations

  • Massachusetts Institute of Technology

Tags

DTIC Thesaurus Topics

  • Aspect Ratio
  • Ceramic Materials
  • Chemical Vapor Deposition
  • Current Density
  • Current Limiters
  • Electric Fields
  • Electrical Engineering
  • Electron Microscopes
  • Electron Microscopy
  • Electron Tubes
  • Electrostatic Fields
  • Fabrication
  • Field Effect Transistors
  • Field Emission
  • Materials
  • Nanotechnology
  • Oxides

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Plasma Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene