Understanding the Electronic Structure of the a-B5C:Hx-to-Metal Interface

Abstract

The interfacial and bulk electronic structure and charge transport properties of amorphous hydrogenated boron carbide (a-BC:H) were investigated toward its application in solid-state direct-conversion neutron detection. From photoemission spectroscopy and current-voltage measurements, it was found that a range of metals exhibited ohmic injection. From space-charge-limited-current and steady-state photoconductivity measurements, it was found that films could be deposited with the charge carrier mobility and lifetime required for maximum theoretical detection efficiencies for a model planar thin-film (15 um) detector heterostructure scenario.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2016
Accession Number
AD1011068

Entities

People

  • Anthony N. Caruso
  • Gyanendra Bhattarai
  • Michelle M. Paquette

Organizations

  • University of Missouri–Kansas City

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Carrier Mobility
  • Charge Carriers
  • Chemical Vapor Deposition
  • Chemistry
  • Detectors
  • Electromagnetic Fields
  • Electronics Industry
  • Electrons
  • Energy Bands
  • Materials
  • Materials Processing
  • Materials Science
  • Measurement
  • Metal-Semiconductor Junctions
  • Neutron Detectors
  • Semiconductors
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Space
  • Space - Hall-Effect Thruster