Vertical Conduction in the Thin Si/CaF2/Si Structures
Abstract
The silicon-calcium fluoride system has long been considered as a candidate for electrical isolation of silicon, especially in the area of 3D device integration. The relatively small 0.6% lattice mismatch at 300 deg C with Si makes CaF sub 2 a very promising choice. Additionally, CaF sub 2 has the attractive property that it can be patterned directly with electron-beam and ion-beam lithography. However, little attention has been given to the transport properties of the Si-CaF sub 2 heterojunction.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1993
- Accession Number
- AD1015297
Entities
People
- Bruce Gnade
- Chih-chen Cho
- Jeffrey W. Sleight
- Mark A. Reed
Organizations
- Yale University