Sideband Spectroscopy and Dispersion Measurement in Microcavities
Abstract
The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresponding transverse mode families is possible.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 07, 2012
- Accession Number
- AD1015348
Entities
People
- Hansuek Lee
- Jiang Li
- Kerry Vahala
- Ki Y. Yang
Organizations
- California Institute of Technology