Design, Fabrication and Experimental Demonstration of Junction Surface Ion Traps
Abstract
We present the design, fabrication and experimental implementation of surface ion traps with Y-shaped junctions. The traps are designed to minimize the pseudopotential variations in the junction region at the symmetric intersection of three linear segments. We experimentally demonstrate robust linear and junction shuttling with greater than 106 round-trip shuttles without ion loss. By minimizing the direct line of sight between trapped ions and dielectric surfaces, negligible day-to-day and trap-to-trap variations are observed. In addition to high-fidelity single-ion shuttling, multiple-ion chains survive splitting, ion-position swapping and recombining routines. The development of two-dimensional trapping structures is an important milestone for ion-trap quantum computing and quantum simulations.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 29, 2011
- Accession Number
- AD1016760
Entities
People
- C Highstrete
- C Tigges
- D L Moehring
- Daniel Stick
- K M Fortiere
- Matthew G. Blain
- Raymond A. Haltli
Organizations
- Sandia National Laboratories