Experimental Testing of a Van De Graaff Generator as an Electromagnetic Pulse Generator

Abstract

The purpose of this research was to evaluate an existing Van de Graaff generator facility for use as an EMP research tool. In order to assess the Van de Graaff, the unclassified Military Standard 464, which specifies a testing free field wave as having an intensity of 50 kV/m with a time-to-peak, of no more than 5 ns, was used as a baseline for free field analysis and this temporal standard used as a basis for generated currents. Unfortunately, the free field measurements were subject to substantial electronic interference from electromagnetic coupling from internal wall reflections, invalidating the assessment. Therefore the primary research focus was to replicate the temporal character of the current through the Van De Graaff, which would represent the most direct coupling that could be expected from a free field wave. The research indicated that the generated time-to-peak (a.k.a rise time) is an order of magnitude greater than that of the Military Standard 464. The fall time is much faster than specified in Military Standard 464 due to substantial ringing in the line. Proposed improvements to the VDG system are described in this thesis.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2016
Accession Number
AD1017975

Entities

People

  • John S. Leahy

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Capacitance
  • Department Of Defense
  • Electrodes
  • Electromagnetic Fields
  • Flash Lamps
  • Free Field
  • Generators
  • Geometry
  • Impedance
  • Leading Edges
  • Measurement
  • Standards
  • Transmission Lines
  • Van De Graaff Generators
  • Waveforms

Fields of Study

  • Physics

Readers

  • Combustion Dynamics and Shock Wave Physics.
  • Electrical Engineering
  • Systems Analysis and Design

Technology Areas

  • Microelectronics