Gaining Insight Into Femtosecond-scale CMOS Effects using FPGAs
Abstract
Reliability data and accurate compact models for new semiconductor processes are often very expensive to obtain. This paper considers low-cost collection of empirical data using COTS FPGAs and novel self-test. Hardware experiments using a 28 nm FPGA demonstrate isolation of small sets of transistors, detection of subtle aging, and measurement precision more than 10 finer (3060 femtoseconds) than state of the art.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 24, 2015
- Accession Number
- AD1022833
Entities
People
- Kenneth M. Zick
- Matthew French
- Sen Li
Organizations
- University of Southern California