Contributions of Stress and Oxidation on the Formation of Whiskers in Pb-free Solders

Abstract

Understanding the environmental factors influencing formation of tin whiskers on electrodeposited lead free, tin coatings over copper (or copper containing) substrates is the topic of this study. An interim report summarized initial observations as to the role of stress and oxide formation on whisker growth. From the initial results, two main areas were chosen to be the focus of additional research: the demonstration of effects of elastic stress state in the nucleation of whiskers and the confirmation of the effect of oxygen content in the formation of whiskers. Different levels of elastic stress were induced with the incorporation of a custom designed fixture that loaded the sample in a four-point bending configuration and were maintained in an environmental chamber under conditions deemed favorable for whisker growth. The effects of oxygen content were studied by aging substrates in gas vials of varying absolute pressure and different oxygen partial pressure.

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Document Details

Document Type
Technical Report
Publication Date
Jan 29, 2016
Accession Number
AD1024408

Entities

People

  • A. J. Duncan
  • Elizabeth N. Hoffman

Organizations

  • Savannah River National Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Coatings
  • Department Of Defense
  • Deposition (Materials Processing)
  • Elastic Properties
  • Electrodeposition
  • Electroplating
  • Elements
  • Finite Element Analysis
  • Gamma Rays
  • Materials
  • Materials Processing
  • Modulus Of Elasticity
  • Oxides
  • Partial Pressure
  • Substrates
  • Thin Films
  • Tin Coatings

Fields of Study

  • Materials science

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Surface Engineering/Surface Coating Technology.
  • Systems Analysis and Design