X-ray Diffraction System for Advanced Materials Analysis in Research and Education
Abstract
Funds were received and expended to acquire the Rigaku SmartLab high-resolution x-ray diffraction (XRD) system with HyPix-3000 array detector. The SmartLab is suitable for user-friendly measurement reconfiguration to analyze thin films, powders, and nanomaterials. The acquisition supports current materials research at Texas State University, a Hispanic serving institution, and will support future research initiatives based on a 5-year warranty and broad base of university funding to projects. The system is emerging as a major resource in the existing Analysis Research Service Center (RSC), a fee-based user facility which ensures broad access to instrumentation. The XRD complements extensive materials growth and device fabrication RSCs for conducting research supported by federal, state, and industry funding. This support currently includes four Department of Defense awards. The new XRD system replaced an antiquated, single investigator system acquired in 1994 for thin-film analysis. The state-of-the-art SmartLab system provides new capabilities and reduces measurement time to allow expanded usership for both research and education.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 27, 2016
- Accession Number
- AD1025169
Entities
People
- M. Holtz
Organizations
- Texas State University