Scalable Testing Platform for CMOS Read In Integrated Circuits

Abstract

The read-in integrated circuit (RIIC) is an integrated circuit that drives an array of infrared emitters inside of an infrared scene projector (IRSP) system. We have designed different RIICs for four future IRSP systems that are being built by our research group. This paper describes a single scalable testing platform (STP) capable of testing all of our RIICs. This approach reduces the design time and risk associated with RIIC testing. On the hardware side, our platform consists of several custom printed circuit boards. On the software side, our platform consists of a single code base.

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Document Details

Document Type
Technical Report
Publication Date
Mar 31, 2016
Accession Number
AD1025397

Entities

People

  • Fouad Kiamilev
  • Jonathan Dickason
  • Miguel Hernández
  • Nick Waite
  • Peyman Barakshan
  • Rodney Mcgee

Organizations

  • University of Delaware

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Boards
  • Circuits
  • Computers
  • Engineering
  • Flip Chips
  • Infrared Spectra
  • Instrumentation
  • Integrated Circuits
  • Light Emitting Diodes
  • Microcontrollers
  • Printed Circuit Boards
  • Printed Circuits
  • Resource Management
  • Semiconductors
  • Simulations
  • Test And Evaluation
  • Transistors

Fields of Study

  • Computer science

Readers

  • Aerospace Test and Evaluation
  • Computer Engineering
  • Integrated Circuit Design and Technology.