Microelectronics Reliability
Abstract
In this research, an innovative and practical way to use the various physics of failure equations is shown together with accelerated testing for reliability prediction of devices exhibiting multiple failure mechanisms. Also presented was an integrated accelerating and measuring platform to be implemented inside FPGA chips, making the MTOL testing more accurate, allowing these tests at the chip and perhaps at the system level, rather than only at the transistor level. The calibration of physics models with highly accelerated testing of complete commercial devices allows for actual reliability prediction. The MTOL Matrix can provide information about the proportional effect of each failure mechanism; allowing extrapolation of the expected reliability of the device under various conditions.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 17, 2017
- Accession Number
- AD1025465
Entities
People
- Clay Mayberry
- Joseph Bernstein
Organizations
- Air Force Research Laboratory