PASSIVELY ESTIMATING INDEX OF REFRACTION FOR SPECULAR REFLECTORS USING POLARIMETRIC HYPERSPECTRAL IMAGING

Abstract

As off-nadir viewing platforms becoming increasingly prevalent in remote sensing, material classification and ID techniques robust to changing viewing geometries must be developed. Traditionally, either reflectivity or emissivity are used for classification, but these quantities vary with viewing angle. Instead, estimating index of refraction may be advantageous as it is invariant with respect to viewing geometry. This work focuses on estimating index of refraction from LWIR (875-1250 wavenumbers) polarimetric hyperspectral radiance measurements.

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Document Details

Document Type
Technical Report
Publication Date
Dec 22, 2016
Accession Number
AD1032025

Entities

People

  • Jacob A. Martin

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Sensors

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Amorphous Materials
  • Ceramic Materials
  • Detection
  • Detectors
  • Dielectrics
  • Geometry
  • Hyperspectral Imagery
  • Information Science
  • Measurement
  • Optics
  • Polarizers
  • Refraction
  • Refractive Index
  • Supervised Machine Learning
  • Waveplates

Readers

  • Atmospheric Remote Sensing.
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Image Processing and Computer Vision.