Physical-Mechanisms Based Reliability Analysis For Emerging Technologies

Abstract

Space and defense systems require the highest levels of functional performance in order to ensure technical superiority for US forces, but at the same time, levels of reliability exceeding those of commercial systems are required. These two requirements are often in conflict, as the most modern and highest performance devices do not have extensive operational histories upon which reliability models can be built. Thus, it is important to develop more predictive reliability models for advanced technologies, based on physical understanding of the failure mechanisms.

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Document Details

Document Type
Technical Report
Publication Date
May 05, 2017
Accession Number
AD1035037

Entities

People

  • D. M. Fleetwood
  • M. L. Alles
  • Robert A. Reed
  • Ronald D. Schrimpf

Organizations

  • Vanderbilt University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force Research Laboratories
  • Bipolar Junction Transistors
  • Compound Semiconductors
  • Density Functional Theory
  • Dielectrics
  • Dose Rate
  • Electron Mobility
  • Electronics Laboratories
  • Emerging Technology
  • Failure Mode And Effect Analysis
  • High Electron Mobility Transistors
  • Ionizing Radiation
  • Materials
  • Microwave Amplifiers
  • Radiation Effects
  • Semiconductors
  • Silicon Carbide

Readers

  • Computational Modeling and Simulation
  • Integrated Circuit Design and Technology.
  • Military History / Militaries and War Studies

Technology Areas

  • Space