RF-Trapped Chip Scale Helium Ion Pump (RFT-CHIP)
Abstract
A miniaturized (~1 cc) magnet-less RF electron trap for a helium ion pump is studied, addressing challenges associated with active pumping of atomic microsystems at low pressures (~1 nanoTorr). Two tasks are described: experimental verification of electron trapping, and numerical parametric modeling of electron trapping and ionization. It is found experimentally that the steady state floating potentials on electrodes near the trap become more negative after applying certain RF power levels, demonstrating electron trapping. The electron density within the trap is estimated via numerical modeling as ~1000x the density in the electron beam. Estimated Ionization rates are as high as 60E6/cc/s.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 06, 2016
- Accession Number
- AD1041620
Entities
People
- Aram H Markosyan
- Mark Kushner
- Scott Green
- Shiyang Deng
- Yogesh Gianchandani
Organizations
- Board of Regents of the University of Michigan